Buying time for the stuck-at fault model
نویسنده
چکیده
Making predictions about the longevity of the single stuck-at fault model is a highly speculative yet nonetheless popular activit y in the IC test community, and has been for years. Despite the welldocumented analytical shortcomings of the SSA fault model as a physical model for defects, SSA fault coverage has yet to be replaced as the standard for test qualit y measurement. How can this be?
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تاریخ انتشار 1998